Low Dose Rate TID Test of Commercial Bipolar Op Amp
By Brandon Norman, posted on October 24th, 2012 in URC Virtual Poster Session
Intern Brandon Norman tests the op amp after taking it out of the radiation chamber of the Keithley 4200 and HP test fixture. Image Credit: URC.
Prairie View A&M University, Texas
Major: Electrical Engineering
Degree Level: Bachelor of Science
Internship Site: NASA Goddard Space Flight Center, Greenbelt, Maryland
Mentor: Dr. Jonathan Pellish
Abstract: This project involved Total Ionizing Dose (TID) tests at the GSFC radiation chamber. The tests were performed using a TLE2022 Bipolar Op Amp as the Device Under Test (DUT). The DUT was subject to a Cobalt 60 source at a Low Dose Rate (LDR). The main values observed were the input bias current, supply current, voltage offset, and current offset. The implication from the results support that the device has characteristics of radiation hardened.
* If you are having trouble viewing this poster, please download it as a pdf.
NASA Daily Image
Hubble Sees 'Space Invader' Image